A Dual-Port Structured Magnetic Field Probe For Effective Circuit Detection

In this paper, a dual-port broadband magnetic field probe is designed. The dual-port design allows the probe to detect electromagnetic characteristics at two different locations in the circuit with each step, effectively improving detection efficiency. A coplanar waveguide structure is adopted to achieve a 10 GHz operating bandwidth. Additionally, by adding fence vias and employing a transmission line width gradient, the probe achieves good impedance matching. Furthermore, the design increases the area of the end ring structure longitudinally, effectively enhancing the probe's sensitivity while maintaining high spatial resolution.