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A Dimension-Reduced FEM for Low-Frequency Electric Field Analysis of Ultra-Thin Metallic Interconnects

  • Han Zhang
  • , Dongrong Zhang
  • , Qiang Ren*
  • *此作品的通讯作者
  • Beihang University
  • Zhongguancun Laboratory

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

A dimension-reduced finite element method (FEM) is proposed for low-frequency electric field analysis of ultra-thin metallic interconnect structures. Conventional three-dimensional modeling of vias and routing lines requires extremely fine meshes along the thickness direction, leading to excessive computational cost. To overcome this limitation, the thin volumetric conductors are represented using a thickness-collapsed surface formulation through element mapping to a reference triangular element, with modified basis functions. As a result, the mesh density and degrees of freedom are significantly reduced while maintaining accuracy. Representative numerical results are presented to validate the effectiveness of the proposed approach.

源语言英语
主期刊名IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2026 - Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798331558208
DOI
出版状态已出版 - 2026
活动2026 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2026 - Valencia, 西班牙
期限: 1 7月 2026 → 3 7月 2026

丛书

姓名IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2026 - Proceedings

会议

会议2026 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2026
国家/地区西班牙
市Valencia
时期1/07/26 → 3/07/26

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