A description method for automatic test equipment model

This paper proposes a hierarchical description method for automatic test equipment (ATE) model in electronic products testing. The description method divides ATE model into three levels of ATE nodes, test functions nodes and test data nodes. By using functions and data of electronic products ATE as model basis, OPC Unified Architecture (OPC UA) as model framework, XML as model language, a complete and compact ATE model is given to validate the feasibility of this description method. A simulation prototype verifies the availability of the ATE model.