A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn

Qiang Chen; Yunxia Chen; Rui Kang

doi:10.1109/PHM.2012.6228820

A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn

Qiang Chen^*
, Yunxia Chen
, Rui Kang

^*此作品的通讯作者

可靠性与系统工程学院

Beihang University

科研成果: 会议稿件 › 论文 › 同行评审

摘要

The method of moving cut data-approximate entropy (MC-ApEn) is used in this paper. With the data obtained by an enhancement testing of a certain kind of conductive film resistors, the discriminant method of consistency of accelerated degradation mechanism is presented. Finally, the new judgment method of consistency of accelerated degradation mechanism based on the data of enhancement testing is discussed.

源语言	英语
DOI	https://doi.org/10.1109/PHM.2012.6228820
出版状态	已出版 - 2012
活动	2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012 - Beijing, 中国期限: 23 5月 2012 → 25 5月 2012

会议

会议	2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012
国家/地区	中国
市	Beijing
时期	23/05/12 → 25/05/12

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10.1109/PHM.2012.6228820

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@conference{cd2990c57c7641d9abff7d05512be84b,

title = "A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn",

abstract = "The method of moving cut data-approximate entropy (MC-ApEn) is used in this paper. With the data obtained by an enhancement testing of a certain kind of conductive film resistors, the discriminant method of consistency of accelerated degradation mechanism is presented. Finally, the new judgment method of consistency of accelerated degradation mechanism based on the data of enhancement testing is discussed.",

keywords = "MC-ApEn, degradation mechanism consistency, enhancement testing",

author = "Qiang Chen and Yunxia Chen and Rui Kang",

year = "2012",

doi = "10.1109/PHM.2012.6228820",

language = "英语",

note = "2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012 ; Conference date: 23-05-2012 Through 25-05-2012",

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TY - CONF

T1 - A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn

AU - Chen, Qiang

AU - Chen, Yunxia

AU - Kang, Rui

PY - 2012

Y1 - 2012

N2 - The method of moving cut data-approximate entropy (MC-ApEn) is used in this paper. With the data obtained by an enhancement testing of a certain kind of conductive film resistors, the discriminant method of consistency of accelerated degradation mechanism is presented. Finally, the new judgment method of consistency of accelerated degradation mechanism based on the data of enhancement testing is discussed.

AB - The method of moving cut data-approximate entropy (MC-ApEn) is used in this paper. With the data obtained by an enhancement testing of a certain kind of conductive film resistors, the discriminant method of consistency of accelerated degradation mechanism is presented. Finally, the new judgment method of consistency of accelerated degradation mechanism based on the data of enhancement testing is discussed.

KW - MC-ApEn

KW - degradation mechanism consistency

KW - enhancement testing

UR - https://www.scopus.com/pages/publications/84866163023

U2 - 10.1109/PHM.2012.6228820

DO - 10.1109/PHM.2012.6228820

M3 - 论文

AN - SCOPUS:84866163023

T2 - 2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012

Y2 - 23 May 2012 through 25 May 2012

ER -

A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn

摘要

会议

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