TY - GEN
T1 - A CT Defect Detection Method for Additive Manufacturing Workpieces Driven by Digital Models and Virtual Simulation
AU - Ning, Li
AU - Gao, Zhiyu
AU - Lan, Haibin
AU - Zeng, Baixiang
AU - Xu, Linhai
AU - Guan, Wei
AU - Chen, Xiaolong
AU - Zheng, Lindan
AU - Wang, Qianni
AU - Wang, Bingyang
AU - Zhang, Changsheng
AU - Fu, Jian
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Additive manufacturing (AM) technology has been widely applied in key fields such as aerospace due to its high design freedom and material utilization rate. However, internal defects of parts are difficult to be captured by traditional non-destructive testing methods. Industrial computed tomography (CT) can provide three-dimensional visualization of parts, offering a high-precision means for defect detection. Nevertheless, the scarcity and high acquisition cost of real defect sample data limit the training and application of deep learning. To address this issue, an industrial CT defect detection method for AM workpieces driven by CAD digital models and virtual simulation is proposed. Firstly, typical internal pore defects are parameterizedly introduced into a defect-free CAD model to form a defective digital model. Then, CT projection and reconstruction simulations are carried out to generate a large-scale simulated CT dataset. The generated simulated data can be used not only for comparing defect-free simulations with real CT data to assist manual and traditional algorithm defect identification but also as a training set for deep learning models, improving the accuracy and generalization ability of defect detection. A case study of a 3D resin-printed blade part was conducted to verify the effectiveness of the proposed method. The simulation and real scanning results were compared and analyzed, and the application prospects of the method were discussed, providing a new technical approach for non-destructive testing of AM.
AB - Additive manufacturing (AM) technology has been widely applied in key fields such as aerospace due to its high design freedom and material utilization rate. However, internal defects of parts are difficult to be captured by traditional non-destructive testing methods. Industrial computed tomography (CT) can provide three-dimensional visualization of parts, offering a high-precision means for defect detection. Nevertheless, the scarcity and high acquisition cost of real defect sample data limit the training and application of deep learning. To address this issue, an industrial CT defect detection method for AM workpieces driven by CAD digital models and virtual simulation is proposed. Firstly, typical internal pore defects are parameterizedly introduced into a defect-free CAD model to form a defective digital model. Then, CT projection and reconstruction simulations are carried out to generate a large-scale simulated CT dataset. The generated simulated data can be used not only for comparing defect-free simulations with real CT data to assist manual and traditional algorithm defect identification but also as a training set for deep learning models, improving the accuracy and generalization ability of defect detection. A case study of a 3D resin-printed blade part was conducted to verify the effectiveness of the proposed method. The simulation and real scanning results were compared and analyzed, and the application prospects of the method were discussed, providing a new technical approach for non-destructive testing of AM.
KW - 3D printing
KW - Additive manufacturing
KW - Defect identification
KW - Digital model
KW - Industrial CT
KW - Virtual simulation
UR - https://www.scopus.com/pages/publications/105034173705
U2 - 10.1109/PRAI67447.2025.11412753
DO - 10.1109/PRAI67447.2025.11412753
M3 - 会议稿件
AN - SCOPUS:105034173705
T3 - 8th International Conference on Pattern Recognition and Artificial Intelligence, PRAI 2025
SP - 277
EP - 282
BT - 8th International Conference on Pattern Recognition and Artificial Intelligence, PRAI 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th International Conference on Pattern Recognition and Artificial Intelligence, PRAI 2025
Y2 - 15 August 2025 through 17 August 2025
ER -