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A CT Defect Detection Method for Additive Manufacturing Workpieces Driven by Digital Models and Virtual Simulation

  • Li Ning
  • , Zhiyu Gao*
  • , Haibin Lan
  • , Baixiang Zeng
  • , Linhai Xu
  • , Wei Guan
  • , Xiaolong Chen
  • , Lindan Zheng
  • , Qianni Wang
  • , Bingyang Wang
  • , Changsheng Zhang
  • , Jian Fu*
  • *此作品的通讯作者
  • CNC Processing Plant of AVIC Xi'an Aircraft Industry Company LTD
  • Beihang University
  • Beijing Institute of Aeronautical Materials
  • China Aviation Industry Corporation

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Additive manufacturing (AM) technology has been widely applied in key fields such as aerospace due to its high design freedom and material utilization rate. However, internal defects of parts are difficult to be captured by traditional non-destructive testing methods. Industrial computed tomography (CT) can provide three-dimensional visualization of parts, offering a high-precision means for defect detection. Nevertheless, the scarcity and high acquisition cost of real defect sample data limit the training and application of deep learning. To address this issue, an industrial CT defect detection method for AM workpieces driven by CAD digital models and virtual simulation is proposed. Firstly, typical internal pore defects are parameterizedly introduced into a defect-free CAD model to form a defective digital model. Then, CT projection and reconstruction simulations are carried out to generate a large-scale simulated CT dataset. The generated simulated data can be used not only for comparing defect-free simulations with real CT data to assist manual and traditional algorithm defect identification but also as a training set for deep learning models, improving the accuracy and generalization ability of defect detection. A case study of a 3D resin-printed blade part was conducted to verify the effectiveness of the proposed method. The simulation and real scanning results were compared and analyzed, and the application prospects of the method were discussed, providing a new technical approach for non-destructive testing of AM.

源语言英语
主期刊名8th International Conference on Pattern Recognition and Artificial Intelligence, PRAI 2025
出版商Institute of Electrical and Electronics Engineers Inc.
277-282
页数6
ISBN(电子版)9798331574055
DOI
出版状态已出版 - 2025
活动8th International Conference on Pattern Recognition and Artificial Intelligence, PRAI 2025 - Guiyang, 中国
期限: 15 8月 202517 8月 2025

出版系列

姓名8th International Conference on Pattern Recognition and Artificial Intelligence, PRAI 2025

会议

会议8th International Conference on Pattern Recognition and Artificial Intelligence, PRAI 2025
国家/地区中国
Guiyang
时期15/08/2517/08/25

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