A comprehensive belief reliability analysis method for electronic systems considering the effect of failure mechanisms

Complex electronic systems have been extensively employed in various engineering scenarios, necessitating the use of reasonable and effective methods for analyzing their reliability from the perspective of their performance to ensure smooth and secure operation. While numerous Physics of Failure (PoF)-based methods have identified and modeled failure causes for different system performances, there is still a lack of discussion on the direct correlation between damage caused by failure mechanisms and corresponding performance, as well as consideration of comprehensive performance requirements when analyzing system reliability. To address these issues, this paper proposes a comprehensive belief reliability analysis method for electronic systems to establish a connection between the failure mechanism and performance parameters. An S-O-P (Structure-overload-performance) belief reliability framework has been provided to analyze the reliability of complex electronic systems based on the proposed definitions of structure-related reliability, overload-related reliability and performance reliability. To implement the framework, an Improved Hybrid Bond Graph (IHBG) method is studied, and the interactions and uncertainties of the failure process are quantified. Furthermore, a delay-trigger electronic controller is utilized as an example to demonstrate the effectiveness and rationality of the proposed reliability analysis method.