TY - JOUR
T1 - A cloud model-based method for the analysis of accelerated life test data
AU - Zhang, Wenjin
AU - Liu, Shunli
AU - Sun, Bo
AU - Liu, Yue
AU - Pecht, Michael
N1 - Publisher Copyright:
© 2014 Elsevier Ltd. All rights reserved.
PY - 2015/1/1
Y1 - 2015/1/1
N2 - Various curve fitting models, including the Arrhenius stress model, inverse power law model, and Eyring model have been used to model the load (stress) - life relationship to aid in planning accelerated life tests; that is, the relationship between the mean of the sample lifetimes and the testing stress level. The load-life relationship is a one-to-one relationship: one mean of the sample lifetimes corresponds to one testing stress level. However, due to the random uncertainties existing in the testing stress, the relationship should be a many-to-many relationship rather than one testing stress corresponding one mean lifetime of the tested product. Based on the one-to-one relationship of the mean of the sample lifetimes to the testing stress level, a many-to-many relationship can be derived using the reasoning method presented in this paper. The reasoning method is constructed as 'If X, then Y.' X is termed the rule antecedent, and Y is called the rule consequent. They are constructed with the stress values and the sample lifetimes, respectively, based on the cloud model, which represents random uncertainty and fuzzy uncertainty. The reasoning method presented is called the multi-rule-based cloud reasoner, which can refine the one-to-one relationship established by models such as the Arrhenius stress model to a many-to-many relationship. In the case study, the multi-rule-based cloud reasoner was applied to a thermal stress accelerated life test of ammunition fuses. The results from the multi-rule-based cloud reasoner were compared with the estimation results from a normal cloud generator under a stress level of 20 °C. The results showed that the many-to-many relationship between the uncertain stress level and the means of the sample lifetimes was derived by the multi-rule-based cloud reasoner.
AB - Various curve fitting models, including the Arrhenius stress model, inverse power law model, and Eyring model have been used to model the load (stress) - life relationship to aid in planning accelerated life tests; that is, the relationship between the mean of the sample lifetimes and the testing stress level. The load-life relationship is a one-to-one relationship: one mean of the sample lifetimes corresponds to one testing stress level. However, due to the random uncertainties existing in the testing stress, the relationship should be a many-to-many relationship rather than one testing stress corresponding one mean lifetime of the tested product. Based on the one-to-one relationship of the mean of the sample lifetimes to the testing stress level, a many-to-many relationship can be derived using the reasoning method presented in this paper. The reasoning method is constructed as 'If X, then Y.' X is termed the rule antecedent, and Y is called the rule consequent. They are constructed with the stress values and the sample lifetimes, respectively, based on the cloud model, which represents random uncertainty and fuzzy uncertainty. The reasoning method presented is called the multi-rule-based cloud reasoner, which can refine the one-to-one relationship established by models such as the Arrhenius stress model to a many-to-many relationship. In the case study, the multi-rule-based cloud reasoner was applied to a thermal stress accelerated life test of ammunition fuses. The results from the multi-rule-based cloud reasoner were compared with the estimation results from a normal cloud generator under a stress level of 20 °C. The results showed that the many-to-many relationship between the uncertain stress level and the means of the sample lifetimes was derived by the multi-rule-based cloud reasoner.
KW - Accelerated life test
KW - Cloud model
KW - Life cloud
KW - Multi-rule-based cloud reasoner
KW - Stress cloud
KW - Uncertainty
UR - https://www.scopus.com/pages/publications/84920528237
U2 - 10.1016/j.microrel.2014.10.006
DO - 10.1016/j.microrel.2014.10.006
M3 - 文章
AN - SCOPUS:84920528237
SN - 0026-2714
VL - 55
SP - 123
EP - 128
JO - Microelectronics Reliability
JF - Microelectronics Reliability
IS - 1
ER -