摘要
Reliability test of avionics system is essential in its use and upgrade. Especially in the current development situation where multi-batch avionics systems are used in practice. there is an urgent need for efficient, fast, and accurate reliability test of the systems. Since the high security requirement of the avionics systems restricts embedding the test software, external test devices are required to test avionics systems through their specified interfaces. What's more, no leakage is allowed when testing the avionics systems. The test devices are coupled with the avionics system under test and thus the test process is coupled with the test devices which make it difficult to test multiple avionics systems in parallel. Thus, by introducing the logic test device, this paper presents a hierarchical framework for the parallel testing of the avionics systems that could solve the problem of coupling between the test devices and the specified avionics system, ensuring the security of the test process. Based on the description of test behaviors on the logic test device, the test gateway devices, and the tested hosts, a device collaborating mechanism for the general parallel testing of avionics systems is presented. This system could solve the problem of coupling between the test process and the test devices, and thus could support the parallel testing of multiple avionics systems. Finally, a general parallel test system of avionics systems is implemented and the effectiveness of the proposed method is verified by practical application and experimental analysis.
| 投稿的翻译标题 | Decoupling method for test process and test devices in parallel testing of avionics systems |
|---|---|
| 源语言 | 繁体中文 |
| 文章编号 | 322818 |
| 期刊 | Hangkong Xuebao/Acta Aeronautica et Astronautica Sinica |
| 卷 | 40 |
| 期 | 8 |
| DOI | |
| 出版状态 | 已出版 - 25 8月 2019 |
关键词
- Avionics systems
- Decoupling
- Device collaboration
- Parallel testing
- Test devices
- Test process
指纹
探究 '航电系统并行检测过程与检测设备解耦方法' 的科研主题。它们共同构成独一无二的指纹。引用此
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