基于多变量优化的恒定应力加速退化试验设计

In order to carry out the accelerated degradation test for high reliability and long-life products efficiently, an optimal design method of constant stress accelerated degradation test are proposed, which can simultaneously optimize acceleration stress level, sample number and test time at each level. The accelerated degradation model is constructed based on the Wiener process and the Arrhenius model. The estimation accuracy of reliable life is taken as objective function, and the total cost of the test is defined as the constrain. The genetic algorithm is applied to realize the search of the optimal test scheme, and the effectiveness of the optimal scheme is rerified through the sensitivity analysis. An accelerated degradation test for a carbon film resistor is optimally designed as a case study to demonstrate the rationality of the proposed method. Finally, the sensitivity of the model parameters to the optimization results is analyzed to illustrate the robustness of the optimal design procedure.