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Welcome message from the chairpersons

  • Hongjian Zhang*
  • , Kang Lee
  • , Yong Yan
  • , Ruth Dyer
  • *Corresponding author for this work
  • Zhejiang University
  • National Institute of Standards and Technology
  • University of Kent
  • Kansas State University

Research output: Contribution to journalEditorial

Original languageEnglish
Article number5944366
Pages (from-to)liii
JournalConference Record - IEEE Instrumentation and Measurement Technology Conference
DOIs
StatePublished - 2011
Externally publishedYes
Event2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011 - Binjiang, Hangzhou, China
Duration: 10 May 201112 May 2011

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