Ways of on-line test for digital IC

L. Yuying; H. Yunhua; C. Hongbing; C. Jinyan

Ways of on-line test for digital IC

L. Yuying^*
, H. Yunhua
, C. Hongbing
, C. Jinyan

^*Corresponding author for this work

Ordnance Engineering College

Research output: Contribution to conference › Paper › peer-review

Abstract

Characteristic and application range of vector and some non-vector on-line test technique are analyzed in this paper. Then on-line test technique based on dynamic signal comparison is proposed. It is realized by VXIbus instrument. The technique avoids using neilsbed. It tests rapidly and uses conveniently.

Original language	English
Pages	676-678
Number of pages	3
State	Published - 2001
Externally published	Yes
Event	4th International Symposium on Test and Measurement (ISTM/2001) - Shanghai, China Duration: 1 Jun 2001 → 3 Jun 2001

Conference

Conference	4th International Symposium on Test and Measurement (ISTM/2001)
Country/Territory	China
City	Shanghai
Period	1/06/01 → 3/06/01

Keywords

Digital IC
Dynamic signal comparison
On-line test

Cite this

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title = "Ways of on-line test for digital IC",

abstract = "Characteristic and application range of vector and some non-vector on-line test technique are analyzed in this paper. Then on-line test technique based on dynamic signal comparison is proposed. It is realized by VXIbus instrument. The technique avoids using neilsbed. It tests rapidly and uses conveniently.",

keywords = "Digital IC, Dynamic signal comparison, On-line test",

author = "L. Yuying and H. Yunhua and C. Hongbing and C. Jinyan",

year = "2001",

language = "英语",

pages = "676--678",

note = "4th International Symposium on Test and Measurement (ISTM/2001) ; Conference date: 01-06-2001 Through 03-06-2001",

}

TY - CONF

T1 - Ways of on-line test for digital IC

AU - Yuying, L.

AU - Yunhua, H.

AU - Hongbing, C.

AU - Jinyan, C.

PY - 2001

Y1 - 2001

N2 - Characteristic and application range of vector and some non-vector on-line test technique are analyzed in this paper. Then on-line test technique based on dynamic signal comparison is proposed. It is realized by VXIbus instrument. The technique avoids using neilsbed. It tests rapidly and uses conveniently.

AB - Characteristic and application range of vector and some non-vector on-line test technique are analyzed in this paper. Then on-line test technique based on dynamic signal comparison is proposed. It is realized by VXIbus instrument. The technique avoids using neilsbed. It tests rapidly and uses conveniently.

KW - Digital IC

KW - Dynamic signal comparison

KW - On-line test

UR - https://www.scopus.com/pages/publications/0034862783

M3 - 论文

AN - SCOPUS:0034862783

SP - 676

EP - 678

T2 - 4th International Symposium on Test and Measurement (ISTM/2001)

Y2 - 1 June 2001 through 3 June 2001

ER -

Ways of on-line test for digital IC

Abstract

Conference

Keywords

Other files and links

Cite this