TY - GEN
T1 - Using Metamorphic Testing to Evaluate DNN Coverage Criteria
AU - Zhou, Jinyi
AU - Qiu, Kun
AU - Zheng, Zheng
AU - Chen, Tsong Yueh
AU - Poon, Pak Lok
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/10
Y1 - 2020/10
N2 - Generating test cases and further evaluating their 'quality' are two critical topics in the area of Deep Neural Networks (DNNs). In this domain, different studies (e.g., [1], [2]) have reported that metamorphic testing (MT) serves as an effective test case generation method, where an initial set of source test cases is augmented with identified metamorphic relations (MRs) to produce the corresponding set of follow-up test cases. As a result, the fault detection effectiveness (and, hence, the 'quality') of the resulting test suite T, containing these source and follow-up test cases, will most likely be increased.
AB - Generating test cases and further evaluating their 'quality' are two critical topics in the area of Deep Neural Networks (DNNs). In this domain, different studies (e.g., [1], [2]) have reported that metamorphic testing (MT) serves as an effective test case generation method, where an initial set of source test cases is augmented with identified metamorphic relations (MRs) to produce the corresponding set of follow-up test cases. As a result, the fault detection effectiveness (and, hence, the 'quality') of the resulting test suite T, containing these source and follow-up test cases, will most likely be increased.
KW - Deep Neural Networks, Metamorphic relations, Coverage criteria, Test adequacy
UR - https://www.scopus.com/pages/publications/85099795902
U2 - 10.1109/ISSREW51248.2020.00055
DO - 10.1109/ISSREW51248.2020.00055
M3 - 会议稿件
AN - SCOPUS:85099795902
T3 - Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020
SP - 147
EP - 148
BT - Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020
A2 - Vieira, Marco
A2 - Madeira, Henrique
A2 - Antunes, Nuno
A2 - Zheng, Zheng
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 31st IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2020
Y2 - 12 October 2020 through 15 October 2020
ER -