Uncertain Degradation Process Modeling Method of Integrated Circuit Chip

As an important part of electronic products, it is worth paying attention to whether integrated circuit chip can work reliably for a long time. In this paper, based on reliability scientific experiment including performance consistency experiment, reliability domain experiment and degradation law experiment, we use uncertain hypothesis test to determine consistency of performance parameter, and give a method to construct uncertain degradation process model with small samples by using arithmetic Liu process and uncertain maximum likelihood estimation. Taking operational amplifier as an example, the reliability scientific experiment is carried out. Ultimately, it is concluded that the degradation process interval obtained by uncertain maximum likelihood estimation is more in line with the experiment data than that acquired by least squares principle.