Abstract
InAs nanocrystals embedded in SiO2 matrix have been fabricated by a radio-frequency magnetron co-sputtering technique without postannealing. X-ray photoelectron spectra and Raman spectroscopy strongly suggest the existence of InAs nanocrystals in the SiO2 matrix. From the optical absorption spectrum, the absorption edge exhibits a very large blueshift of 3.3 eV with respect to that of bulk InAs. The double-peak ultraviolet photoluminescence is observed. Our experimental results show that this double-peak phenomenon originates from the radiative recombination of the quantum-confined electron-heavy hole excitons and electron-split-off hole excitons.
| Original language | English |
|---|---|
| Pages (from-to) | 2586-2588 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 70 |
| Issue number | 19 |
| DOIs | |
| State | Published - 12 May 1997 |
| Externally published | Yes |
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