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Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle

  • Jie Lin
  • , Yang Shang
  • , Xiaoxia Li
  • , Jian Yu
  • , Xiaotian Wang
  • , Lin Guo*
  • *Corresponding author for this work
  • Beihang University

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number1604797
JournalAdvanced Materials
Volume29
Issue number5
DOIs
StatePublished - Feb 2017

Keywords

  • charge-transfer
  • defects
  • electrostatic adsorption
  • self-assembly
  • single-particle SERS

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