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Ultra-compact broadband TE-pass polarizer based on vanadate-nanowire-integrated SOI waveguides

  • Yusheng Bian
  • , Lei Kang
  • , Qiang Ren
  • , Ping Werner
  • , Douglas H. Werner

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An ultra-compact TE-pass polarizer is numerically demonstrated at telecommunication wavelengths by integrating a vanadate nanowire with a SOI platform. Results show that a device of 15 μm in length is capable of achieving a high extinction ratio of 22 ∼ 34 dB, in conjunction with a low insertion loss of 0.18 ∼ 0.23 dB in a wavelength range of 1.52 ∼ 1.62 μm.

Original languageEnglish
Title of host publication2017 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), USNC-URSI 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages33-34
Number of pages2
ISBN (Electronic)9781509044122
DOIs
StatePublished - 18 Oct 2017
Externally publishedYes
Event2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, USNC-URSI 2017 - San Diego, United States
Duration: 9 Jul 201714 Jul 2017

Publication series

Name2017 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), USNC-URSI 2017

Conference

Conference2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, USNC-URSI 2017
Country/TerritoryUnited States
CitySan Diego
Period9/07/1714/07/17

Keywords

  • Polarizer
  • polarization dependent loss
  • silicon-on-insulator
  • transparent conducting material
  • vanadate

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