Skip to main navigation Skip to search Skip to main content

Tuning the pinning direction of giant magnetoresistive sensor by post annealing process

  • Zhiqiang Cao
  • , Yiming Wei
  • , Wenjing Chen
  • , Shaohua Yan
  • , Lin Lin
  • , Zhi Li
  • , Lezhi Wang
  • , Huaiwen Yang*
  • , Qunwen Leng*
  • , Weisheng Zhao*
  • *Corresponding author for this work
  • Beihang University
  • Goertek Inc.

Research output: Contribution to journalArticlepeer-review

Abstract

The Internet of Things has created an increasing demand for giant magnetoresistive (GMR) sensor owing to its high sensitivity, low power-consumption and small size. A full Wheatstone bridge GMR sensor is fabricated on 6-inch wafers with an annealing process on patterned devices. It can be observed that GMR resistors could have different pinning directions in one wafer by magnetic resistance measurements and MATLAB simulations. The full Wheatstone bridge device shows a sensitivity of 2 mV/V/mT in a linear range of ±6 mT, and its angular response to the surrounding magnetic field is as low as 0.08 mT. These results demonstrate a new approach to high-sensitive and low-cost GMR sensors with a controllable post annealing process.

Original languageEnglish
Article number162402
JournalScience China Information Sciences
Volume64
Issue number6
DOIs
StatePublished - Jun 2021

Keywords

  • GMR sensor
  • annealing
  • full Wheatstone bridge
  • simulation

Fingerprint

Dive into the research topics of 'Tuning the pinning direction of giant magnetoresistive sensor by post annealing process'. Together they form a unique fingerprint.

Cite this