Transverse Error of ICP Piezoelectric Accelerometers and Its Correction Method in 6D Micro-vibration Excitation System

  • Yan Zheng*
  • , Zhicheng Zhou
  • , Hai Huang
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Due to the inherent transverse sensitivity of the piezoelectric accelerometer, it can cause transverse errors far beyond the resolution of the sensor in the measurement of a 6D micro-vibration excitation system(6D-MVES). The experiments are conducted to verify the effects of transverse errors on the measurement of 6D micro-vibration and vibration control. Moreover, the transverse sensitivity of the accelerometer and the positive direction of the transverse sensitivity axis are experimentally measured at the same time. Finally, the transverse sensitivity correction method using the transverse sensitivity correction matrix in 6D-MVES is proposed, and the improvement on the accuracy of micro-vibration measurement and control is verified by experiments.

Original languageEnglish
Title of host publication2021 3rd International Symposium on Robotics and Intelligent Manufacturing Technology, ISRIMT 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages362-367
Number of pages6
ISBN (Electronic)9781665437189
DOIs
StatePublished - 2021
Event3rd International Symposium on Robotics and Intelligent Manufacturing Technology, ISRIMT 2021 - Changzhou, China
Duration: 24 Sep 202126 Sep 2021

Publication series

Name2021 3rd International Symposium on Robotics and Intelligent Manufacturing Technology, ISRIMT 2021

Conference

Conference3rd International Symposium on Robotics and Intelligent Manufacturing Technology, ISRIMT 2021
Country/TerritoryChina
CityChangzhou
Period24/09/2126/09/21

Keywords

  • 6D micro-vibration excitation system
  • ICP piezoelectric accelerometer
  • linear correction method of transverse error
  • transverse error
  • transverse sensitivity axis

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