Transient Fault Detection and Recovery Mechanisms in μC/OS-II

  • Chengrui He
  • , Li Zhang
  • , Gang Wang
  • , Ziqi Zhen
  • , Lei Wang*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In avionics, satellites are widely used in meteorology, navigation and investigation. Satellites in space, however, are subject to radiation that causes transient fault. This often leads to single event upset on the logic state of device, undermining the stability and the correctness of the system. For example, transient fault can cause errors in the program execution flow, changing the state of or even crashing the system. In order to solve these problems, this paper puts forward a coarse-grained error detection scheme based on function-call relationships. We instrument signature codes at function entry and exit points at compile time to perform dynamic detection at runtime. We apply this method in the μC/OS-II kernel on a DSP platform. The coarse-grained error detection technology can reduce storage overhead effectively compared with basic block-based detection technology. For the moment, this method could be used in imbedded operating systems μC/OS-II, and it can simulate a program flow error caused by transient fault with the method of fault injection. With this method, it can help to detect the occurrence of an error and guarantee the normal running of the system using recovery mechanism. Finally, the result shows that technology of transient fault detection which is based on function call relationship could detect errors effectively, which guarantees the reliability and security of the running system.

Original languageEnglish
Title of host publicationSoftware Analysis, Testing, and Evolution - 8th International Conference, SATE 2018, Proceedings
EditorsLei Bu, Yingfei Xiong
PublisherSpringer Verlag
Pages202-218
Number of pages17
ISBN (Print)9783030042714
DOIs
StatePublished - 2018
Event8th International Conference on Software Analysis, Testing, and Evolution, SATE 2018 - Shenzheng, China
Duration: 23 Nov 201824 Nov 2018

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume11293 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference8th International Conference on Software Analysis, Testing, and Evolution, SATE 2018
Country/TerritoryChina
CityShenzheng
Period23/11/1824/11/18

Keywords

  • Static instrumentation
  • Transient fault
  • μC/OS-II

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