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Towards Real-World Prohibited Item Detection: A Large-Scale X-ray Benchmark

  • Boying Wang
  • , Libo Zhang*
  • , Longyin Wen
  • , Xianglong Liu
  • , Yanjun Wu
  • *Corresponding author for this work
  • CAS - Institute of Software
  • University of Chinese Academy of Sciences
  • JD Finance America Corporation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Automatic security inspection using computer vision technology is a challenging task in real-world scenarios due to various factors, including intra-class variance, class imbalance, and occlusion. Most of the previous methods rarely solve the cases that the prohibited items are deliberately hidden in messy objects due to the lack of large-scale datasets, restricted their applications in real-world scenarios. Towards real-world prohibited item detection, we collect a large-scale dataset, named as PIDray, which covers various cases in real-world scenarios for prohibited item detection, especially for deliberately hidden items. With an intensive amount of effort, our dataset contains 12 categories of prohibited items in 47, 677 X-ray images with high-quality annotated segmentation masks and bounding boxes. To the best of our knowledge, it is the largest prohibited items detection dataset to date. Meanwhile, we design the selective dense attention network (SDANet) to construct a strong baseline, which consists of the dense attention module and the dependency refinement module. The dense attention module formed by the spatial and channel-wise dense attentions, is designed to learn the discriminative features to boost the performance. The dependency refinement module is used to exploit the dependencies of multi-scale features. Extensive experiments conducted on the collected PIDray dataset demonstrate that the proposed method performs favorably against the state-of-the-art methods, especially for detecting the deliberately hidden items.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE/CVF International Conference on Computer Vision, ICCV 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages5392-5401
Number of pages10
ISBN (Electronic)9781665428125
DOIs
StatePublished - 2021
Event18th IEEE/CVF International Conference on Computer Vision, ICCV 2021 - Virtual, Online, Canada
Duration: 11 Oct 202117 Oct 2021

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499

Conference

Conference18th IEEE/CVF International Conference on Computer Vision, ICCV 2021
Country/TerritoryCanada
CityVirtual, Online
Period11/10/2117/10/21

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