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Topological Hall Effect in Thin Films of an Antiferromagnetic Weyl Semimetal Integrated on Si

  • Xiaoning Wang
  • , Xiaorong Zhou
  • , Han Yan
  • , Peixin Qin
  • , Hongyu Chen
  • , Ziang Meng
  • , Zexin Feng
  • , Li Liu
  • , Zhiqi Liu*
  • *Corresponding author for this work
  • Beihang University

Research output: Contribution to journalArticlepeer-review

Abstract

Since the large room-temperature anomalous Hall effect was discovered in noncollinear antiferromagnets, Mn3Sn has received immense research interest as it exhibits abundant exotic physical properties including Weyl points and enormous potential for antiferromagnetic spintronic device applications. In this work, we report the emergence of the topological Hall effect in Mn3Sn films grown on Si that is the workhorse for the modern highly integrated information technology. Importantly, through a series of systematic comparative experiments, the intriguing topological Hall effect phenomenon related to the appearance of the noncoplanar chiral spin structure is found to be induced by the Mn3Sn/SiO2 interface. Furthermore, it was found that the current injection to a Pt/Mn3Sn bilayer Hall bar device can effectively manipulate the chiral spin structure of Mn3Sn, which demonstrates the feasibility of Si-based noncollinear antiferromagnetic spintronics.

Original languageEnglish
Pages (from-to)7572-7577
Number of pages6
JournalACS Applied Materials and Interfaces
Volume15
Issue number5
DOIs
StatePublished - 8 Feb 2023

Keywords

  • MnSn
  • Si substrate
  • antiferromagnetic Weyl semimetal
  • interfacial effect
  • topological Hall effect

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