Skip to main navigation Skip to search Skip to main content

Three dimemsional electro-thermal coupled Monte Carlo device simulation

  • Xiaoyan Liu
  • , Kangliang Wei
  • , Longxiang Yin
  • , Gang Du
  • , Hai Jiang
  • , Kai Zhao
  • , Lang Zeng
  • , Xing Zhang
  • Peking University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

3D paralleled electro-thermal coupled full band ensemble MC simulation platform is developed for analysis of local heating effect on performance and reliability of semiconductor devices. This new developed simulation platform provides a powerful tool for thermal-aware device and circuit design of nano scale devices.

Original languageEnglish
Title of host publicationProceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014
EditorsJia Zhou, Ting-Ao Tang
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479932962
DOIs
StatePublished - 23 Jan 2014
Externally publishedYes
Event2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014 - Guilin, China
Duration: 28 Oct 201431 Oct 2014

Publication series

NameProceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014

Conference

Conference2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014
Country/TerritoryChina
CityGuilin
Period28/10/1431/10/14

Fingerprint

Dive into the research topics of 'Three dimemsional electro-thermal coupled Monte Carlo device simulation'. Together they form a unique fingerprint.

Cite this