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Thickness-induced anomalous angular-dependent magnetoresistance of La2/3Sr1/3MnO3 thin films grown on SrTiO3

  • Xiaotian Li
  • , Bin Liu
  • , Yiqian Wang*
  • , Xuyan Xue
  • , Guiju Liu
  • , Huaiwen Yang
  • , Jirong Sun
  • *Corresponding author for this work
  • Qingdao University
  • CAS - Institute of Physics

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper the effect of thickness on angular-dependent magnetoresistance (MR) of La2/3Sr1/3MnO3 (LSMO) thin films grown on SrTiO3 is systematically investigated. In films thinner than 8 nm, we observe an anomalous weak peak in the MR curves when the magnetic field is parallel to the film surface. In films thicker than 10 nm, however, the weak peak disappears and a novel MR valley appears when the magnetic field is perpendicular to the film surface. The weak peak is thought to be induced by the formation of two-dimensional electron gas (2DEG) at the interface, which is confirmed by density functional theory calculations. The disappearance of the peak and appearance of the valley in the films thicker than 10 nm is associated with the formation of misfit dislocations near the interface between film and substrate, which are clearly visible in high-resolution transmission electron microscopy images. Our work could shed significant light on the influence of film thickness on 2DEG formation.

Original languageEnglish
Pages (from-to)2339-2346
Number of pages8
JournalJournal of the American Ceramic Society
Volume101
Issue number6
DOIs
StatePublished - Jun 2018
Externally publishedYes

Keywords

  • dislocations
  • magnetoresistance
  • thin films

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