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The typical case study of the electronic product reliability enhancement testing

  • Haixin Peng*
  • , Rui Kang
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Based on the most advanced reliability engineering concept, the paper explored a cost-effective RET testing method aiming to solve the defects found in early design, manufacturing process and components. Three cases were presented in this paper that demonstrated the complete process of how to stimulate and eliminate defects. The solid firsthand case analysis has yield valuable experiences that could benefit electronic products reliability enhancement testing.

Original languageEnglish
Title of host publicationFrontiers of Manufacturing and Design Science III
Pages684-689
Number of pages6
EditionPART 1
DOIs
StatePublished - 2013
Event3rd International Conference on Frontiers of Manufacturing and Design Science, ICFMD 2012 - , Hong Kong SAR
Duration: 11 Dec 201213 Dec 2012

Publication series

NameApplied Mechanics and Materials
NumberPART 1
Volume271
ISSN (Print)1660-9336
ISSN (Electronic)1662-7482

Conference

Conference3rd International Conference on Frontiers of Manufacturing and Design Science, ICFMD 2012
Country/TerritoryHong Kong SAR
Period11/12/1213/12/12

Keywords

  • Design defect
  • Electronic component defect
  • Process defect
  • Reliability enhancement testing (RET)

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