The Structural Reliability Analysis Method of Electronic System Based on the Dependent Failure Processes

Structural failure is a critical failure mode in electronic systems. However, existing reliability analysis methods struggle to comprehensively evaluate the structural performance of such systems. This paper models the structural damage process with the influence of wear-out mechanisms and the structural shock process with the influence of overstress mechanisms. Furthermore, it defines the Dependent Competing Failure Process (DCFP) group to characterize the structural performance of electronic systems from two perspectives: structural durability and ultimate tolerance. The structural reliability of the system is then analyzed under three types of DCFP groups: joint effect type, unilateral dependency type, and bilateral dependency type. Building on this framework, the study further considers the phenomenon of multi-point concurrent structural degradation within electronic systems. Using the unmanned aircraft drive control circuit as a case study, the proposed method is implemented to demonstrate its effectiveness.