The signal detection technology of photoconductive detector with lock-in amplifier

  • Yang Wang
  • , Yani Zhang
  • , Xiangrong He
  • , Guangyu Fang
  • , Haimei Gong

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The noise of photoconductive detector is so weak that the PAR 124A lock-Amplifier is main test facility despite of discontinuation by long-gone manufacturer for decades. The paper uses 124A and 7124 lock-in amplifier system to test noise and response signal of several photoconductive detectors while use the SR830 internal oscillator and thermal noise of pure resistance as standard signal and noise source respectively. The results indicate that the data of two test system can fit each other except the background noise. The 124A lock-in amplifier with 116 transformer is 0.2nV/sHz and 7124 lock-in amplifier with 5184 preamplifier is 0.8 nV/sHz at 1kHz. The impedance of 116 transformer is small and the impedance of 5184 preamplifier is 5M, so the signal of 116 transformer will decay and the 5184 preamplifier won€™t in case of testing the performance of photoconductive detector with larger source resistance. Finally we suggest to use 7124 lock-in amplifier system in case of testing photoconductive detector with larger source resistance and use 124A lock-in amplifier system prior to 7124 lock-in amplifier system in case of testing photoconductive detector with small source resistance.

Original languageEnglish
Title of host publicationSelected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014
EditorsDianyuan Fan, Weimin Bao, Jialing Le, Yueguang Lv, Jianquan Yao, Xiangwan Du, Lijun Wang
PublisherSPIE
ISBN (Electronic)9781628416534
DOIs
StatePublished - 2015
Externally publishedYes
EventConferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014 - Suzhou, China
Duration: 19 Oct 201424 Oct 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9522
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceConferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014
Country/TerritoryChina
CitySuzhou
Period19/10/1424/10/14

Keywords

  • Photoconductive detectors
  • Photoelectric Isolation
  • Pre-Amplifier noise

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