The research on fault equivalent analysis method in testability experiment validation

Fuqun Huang; Ping Xu; Bin Liu; Yue Li

doi:10.1109/ICRMS.2009.5269965

The research on fault equivalent analysis method in testability experiment validation

Fuqun Huang^*
, Ping Xu
, Bin Liu
, Yue Li

^*Corresponding author for this work

School of Reliability and Systems Engineering

Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

With the existing fault injection techniques, many faults that can fully expose testability design defects can not be injected. To solve this problem, a method of fault equivalent analysis is proposed. By this means, some characteristics are extracted from the faults those unable to be injected, and "yield analysis" or "yielded analysis" is performed. Then the minimal cut sets of atom faults is obtained and selected, which are finally equivalent to the atom faults sequence. Applications show that the method not only solves the problem that many faults are not able to be injected, but also ensures the effect of testability experiment validation.

Original language	English
Title of host publication	Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
Pages	902-906
Number of pages	5
DOIs	https://doi.org/10.1109/ICRMS.2009.5269965
State	Published - 2009
Event	2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009 - Chengdu, China Duration: 20 Jul 2009 → 24 Jul 2009

Publication series

Name	Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009

Conference

Conference	2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
Country/Territory	China
City	Chengdu
Period	20/07/09 → 24/07/09

Keywords

Atom fault
Equivalent analysis
Fault characteristics
Fault to be injected
Testability experiment validation

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10.1109/ICRMS.2009.5269965

Cite this

Huang, F., Xu, P., Liu, B., & Li, Y. (2009). The research on fault equivalent analysis method in testability experiment validation. In Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009 (pp. 902-906). Article 5269965 (Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009). https://doi.org/10.1109/ICRMS.2009.5269965

@inproceedings{cb9e5e889bdc46bca74b0e6a550792d4,

title = "The research on fault equivalent analysis method in testability experiment validation",

abstract = "With the existing fault injection techniques, many faults that can fully expose testability design defects can not be injected. To solve this problem, a method of fault equivalent analysis is proposed. By this means, some characteristics are extracted from the faults those unable to be injected, and {"}yield analysis{"} or {"}yielded analysis{"} is performed. Then the minimal cut sets of atom faults is obtained and selected, which are finally equivalent to the atom faults sequence. Applications show that the method not only solves the problem that many faults are not able to be injected, but also ensures the effect of testability experiment validation.",

keywords = "Atom fault, Equivalent analysis, Fault characteristics, Fault to be injected, Testability experiment validation",

author = "Fuqun Huang and Ping Xu and Bin Liu and Yue Li",

year = "2009",

doi = "10.1109/ICRMS.2009.5269965",

language = "英语",

isbn = "9781424449057",

series = "Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009",

pages = "902--906",

booktitle = "Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009",

note = "2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009 ; Conference date: 20-07-2009 Through 24-07-2009",

}

Huang, F, Xu, P, Liu, B & Li, Y 2009, The research on fault equivalent analysis method in testability experiment validation. in Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009., 5269965, Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009, pp. 902-906, 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009, Chengdu, China, 20/07/09. https://doi.org/10.1109/ICRMS.2009.5269965

The research on fault equivalent analysis method in testability experiment validation. / Huang, Fuqun; Xu, Ping; Liu, Bin et al.
Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009. 2009. p. 902-906 5269965 (Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - The research on fault equivalent analysis method in testability experiment validation

AU - Huang, Fuqun

AU - Xu, Ping

AU - Liu, Bin

AU - Li, Yue

PY - 2009

Y1 - 2009

N2 - With the existing fault injection techniques, many faults that can fully expose testability design defects can not be injected. To solve this problem, a method of fault equivalent analysis is proposed. By this means, some characteristics are extracted from the faults those unable to be injected, and "yield analysis" or "yielded analysis" is performed. Then the minimal cut sets of atom faults is obtained and selected, which are finally equivalent to the atom faults sequence. Applications show that the method not only solves the problem that many faults are not able to be injected, but also ensures the effect of testability experiment validation.

AB - With the existing fault injection techniques, many faults that can fully expose testability design defects can not be injected. To solve this problem, a method of fault equivalent analysis is proposed. By this means, some characteristics are extracted from the faults those unable to be injected, and "yield analysis" or "yielded analysis" is performed. Then the minimal cut sets of atom faults is obtained and selected, which are finally equivalent to the atom faults sequence. Applications show that the method not only solves the problem that many faults are not able to be injected, but also ensures the effect of testability experiment validation.

KW - Atom fault

KW - Equivalent analysis

KW - Fault characteristics

KW - Fault to be injected

KW - Testability experiment validation

UR - https://www.scopus.com/pages/publications/77955937585

U2 - 10.1109/ICRMS.2009.5269965

DO - 10.1109/ICRMS.2009.5269965

M3 - 会议稿件

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SN - 9781424449057

T3 - Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009

SP - 902

EP - 906

BT - Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009

T2 - 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009

Y2 - 20 July 2009 through 24 July 2009

ER -

Huang F, Xu P, Liu B, Li Y. The research on fault equivalent analysis method in testability experiment validation. In Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009. 2009. p. 902-906. 5269965. (Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009). doi: 10.1109/ICRMS.2009.5269965

The research on fault equivalent analysis method in testability experiment validation

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