@inproceedings{6f3c45b237864ae596b19b4b89479067,
title = "The Research of Bulk Current Injection Probe Used for ICs Electromagnetic Immunity Measurement",
abstract = "In this paper, the electromagnetic modeling of bulk current injection (BCI) probe is used to analyze the influence of coil factors. In order to analyze the high frequency performance of the probe, the lumped circuit modeling of BCI probe is used to analyze the influence of parasitic capacity. The matching components are used to eliminate high frequency resonance. As a consequence, the results above allow for designing BCI probe with smooth flatness and small insertion loss.",
keywords = "BCI probe, coil winding, matching components, parasitic capacity",
author = "Yaoxing Zhang and Zhaowen Yan and Jianwei Wang and Wei Liu and Zhaoming Ning and Zheng Min",
note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2019 ; Conference date: 21-10-2019 Through 23-10-2019",
year = "2019",
month = oct,
doi = "10.1109/EMCCompo.2019.8919952",
language = "英语",
series = "EMC COMPO 2019 - 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "135--137",
booktitle = "EMC COMPO 2019 - 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits",
address = "美国",
}