@inproceedings{b09d0e53bd1344f0a0a8d26cf7096d09,
title = "The Far-field Estimation for Microstrip Line Based on Near-field Scanning",
abstract = "Far-field test of device is a very significant way for electromagnetic compatibility (EMC) diagnose. And the far-field emission estimation typically requires the accurate information of noise source which usually may not be feasible. Microstrip line is one of the main radiation sources of printed circuit board (PCB), and the surface current on which causes the far-field emission. An efficient numerical equivalent source model based on near-field scanning is proposed in this paper. The near-field tangential component of magnetic field is measured by a magnetic probe to obtain an equivalent source. And the far-field estimation is calculated by this numerical source model. It will save a lot of time compared with the fullwave simulation and far-field test in anechoic chamber.",
keywords = "EMC, equivalent source, far-field estimation, near-field scanning, noise location",
author = "Wei Liu and Zhaowen Yan and Zheng Min",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 12th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2018 ; Conference date: 03-12-2018 Through 06-12-2018",
year = "2018",
month = jul,
day = "2",
doi = "10.1109/ISAPE.2018.8634064",
language = "英语",
series = "2018 12th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2018 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2018 12th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2018 - Proceedings",
address = "美国",
}