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The effect of N+-implanted aluminum substrate on the mechanical properties of TiN films

  • Youming Liu
  • , Liuhe Li*
  • , Ming Xu
  • , Qiulong Chen
  • , Yawei Hu
  • , Xun Cai
  • , Paul K. Chu
  • *Corresponding author for this work
  • Shanghai Jiao Tong University
  • University of Aeronautics and Astronautics
  • City University of Hong Kong

Research output: Contribution to journal › Article › peer-review

Abstract

In this work, nitrogen ions were implanted into an aluminum sample prior to magnetron sputtering for deposition of TiN films by self-designed multifunction ion implanter. An 80 nm thick aluminum nitride (AlN) layer is observed by Auger Electron Spectrometer. We examine the effects of AlN layer on the surface mechanical properties of aluminum by nanoindentation. The effects of the AlN layer on the surface mechanical properties are evaluated. The hardness and elastic modulus of the TiN films on the two different substrates (N ion implanted and unimplanted) are almost constant in the near surface region and decrease with increasing indentation depths. A reduced rate of decrease in the hardness and modulus is observed in the TiN/N+-implanted aluminum. From the results obtained by scratch test, the adhesion strength of TiN/N+-implanted aluminum is better than TiN/ unimplanted sample.

Original languageEnglish
Pages (from-to)2672-2678
Number of pages7
JournalSurface and Coatings Technology
Volume200
Issue number8
DOIs
StatePublished - 24 Jan 2006
Externally publishedYes

Keywords

  • Adhesion strength
  • Modulus
  • N-implanted aluminum
  • Nanohardness
  • TiN films

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