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The approach of graphical user interface testing guided by bayesian model

  • Zhifang Yang*
  • , Zhongxing Yu
  • , Chenggang Bai
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

GUI (graphical user interface) is becoming increasingly important in the software field for the reason that it is a friendly way for the users to interact with the software through GUI. Testing in GUI, however, is faced with many challenges, due to the immense number of event interactions. Testing all possible event interactions is impossible, since the number of required test case is huge in numbers. GUI testing mainly serves two goals: First, to establish confidence in assessment of GUI; Second, to find that more software defects in GUI testing while limiting the number of test cases. For this purpose, any testing method must be better at detecting defects. This article proposed a new technique that can be used for GUI testing, which can guide the GUI testing and find more defects as soon as possible. In this chapter, it introduces an approach of GUI testing guided by Bayesian model optimization scheme, discusses the Bayesian model topology and its issues encountered in the modeling process. It presents solutions in connection with the parameters problem. In the end, a simple case verifies the validity of the model during the GUI testing.

Original languageEnglish
Title of host publicationComputer Engineering and Networking - Proceedings of the 2013 International Conference on Computer Engineering and Network, CENet 2013
PublisherSpringer Verlag
Pages385-393
Number of pages9
ISBN (Print)9783319017655
DOIs
StatePublished - 2014
Event3rd International Conference on Computer Engineering and Network, CENet 2013 - Shanghai, China
Duration: 20 Jul 201321 Jul 2013

Publication series

NameLecture Notes in Electrical Engineering
Volume277 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

Conference3rd International Conference on Computer Engineering and Network, CENet 2013
Country/TerritoryChina
CityShanghai
Period20/07/1321/07/13

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