@inproceedings{7916d86b0c894025a442df0add594636,
title = "The application research of the reliability growth model in the step-down storage life assessment of assembly-level products",
abstract = "The accelerated storage life assessment method based on the reliable growth of assembly-level products exploits the equality of step-down-stress life testing and reliability growth testing, which tackles the problem that the accelerated model is difficult to determine when using the accelerated life assessment method based on the accelerated model. A segmented expression of the function of step-down accelerated model and accumulative step-down accelerated model are derived and the expression of accelerated factor is obtained by using the step-down accelerated model. Combined with the first step test result and the storage objective age limit, the ideal step-down accelerated curve and accumulative ideal step-down accelerated curve are presented. Through the comparison of the follow-up step test results and the first step test result, the objective age limit of the assembly-level products is confirmed. The technology introduced is validated with the resultant coincidence of evaluated field storage lives.",
keywords = "Reliability growth, life confirmation, step-down accelerated model, step-down-stress testing",
author = "Mingge Xu and Xianshan Li and Jun Yao and Xin Chen",
note = "Publisher Copyright: {\textcopyright} 2024 SPIE.; 3rd International Conference on Electronic Information Engineering and Data Processing, EIEDP 2024 ; Conference date: 15-03-2024 Through 17-03-2024",
year = "2024",
doi = "10.1117/12.3032824",
language = "英语",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Jabbar, \{M. A.\} and Pascal Lorenz",
booktitle = "Third International Conference on Electronic Information Engineering and Data Processing, EIEDP 2024",
address = "美国",
}