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The analysis of the electromagnetic performance of planar mesh reflector based on the electrical contact model of metallic junction

  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The mesh surface is the most important part of the mesh reflector. The leakage of the mesh and electrical contact at the junction points may cause the degradation of reflectivity performance. Based on the electronic contact characteristics of the Metal-Insulator-Metal (MIM) structure at the metal junction, the electromagnetic performance of a planar mesh reflector is analyzed. The Floquet theorem is applied here to analyze the performance of the mesh surface illuminated by plane wave. This method can accurately predict the electromagnetic performance of mesh surface. The numerical results show that choosing the appropriate mesh model is very important to evaluate the reflection coefficients of mesh surface, and this has important practical significance to the design of mesh reflector antennas.

Original languageEnglish
Title of host publicationProceedings - 2015 IEEE 12th International Conference on Ubiquitous Intelligence and Computing, 2015 IEEE 12th International Conference on Advanced and Trusted Computing, 2015 IEEE 15th International Conference on Scalable Computing and Communications, 2015 IEEE International Conference on Cloud and Big Data Computing, 2015 IEEE International Conference on Internet of People and Associated Symposia/Workshops, UIC-ATC-ScalCom-CBDCom-IoP 2015
EditorsJianhua Ma, Ali Li, Huansheng Ning, Laurence T. Yang
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages734-737
Number of pages4
ISBN (Electronic)9781467372114
DOIs
StatePublished - 20 Jul 2016
EventProceedings - 2015 IEEE 12th International Conference on Ubiquitous Intelligence and Computing, 2015 IEEE 12th International Conference on Advanced and Trusted Computing, 2015 IEEE 15th International Conference on Scalable Computing and Communications, 2015 IEEE International Conference on Cloud and Big Data Computing, 2015 IEEE International Conference on Internet of People and Associated Symposia/Workshops, UIC-ATC-ScalCom-CBDCom-IoP 2015 - Beijing, China
Duration: 10 Aug 201514 Aug 2015

Publication series

NameProceedings - 2015 IEEE 12th International Conference on Ubiquitous Intelligence and Computing, 2015 IEEE 12th International Conference on Advanced and Trusted Computing, 2015 IEEE 15th International Conference on Scalable Computing and Communications, 2015 IEEE International Conference on Cloud and Big Data Computing, 2015 IEEE International Conference on Internet of People and Associated Symposia/Workshops, UIC-ATC-ScalCom-CBDCom-IoP 2015

Conference

ConferenceProceedings - 2015 IEEE 12th International Conference on Ubiquitous Intelligence and Computing, 2015 IEEE 12th International Conference on Advanced and Trusted Computing, 2015 IEEE 15th International Conference on Scalable Computing and Communications, 2015 IEEE International Conference on Cloud and Big Data Computing, 2015 IEEE International Conference on Internet of People and Associated Symposia/Workshops, UIC-ATC-ScalCom-CBDCom-IoP 2015
Country/TerritoryChina
CityBeijing
Period10/08/1514/08/15

Keywords

  • Electromagnetic performance
  • Electronic contact characteristics
  • Floquet theorem
  • Mesh surface
  • Metal junction

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