The ADT evaluation method based on MCMC

Lizhi Wang; Xiaoyang Li; Tongmin Jiang; Xiaotian Zhuang

doi:10.1109/IEEM.2011.6118116

The ADT evaluation method based on MCMC

Lizhi Wang^*
, Xiaoyang Li
, Tongmin Jiang
, Xiaotian Zhuang

^*Corresponding author for this work

School of Reliability and Systems Engineering

Beihang University
Arizona State University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper proposes an accelerated degradation testing (ADT) evaluation method based on Markov Chain Monte Carlo (MCMC) method. Firstly the degradation model, reliability model and accelerated model of ADT are introduced; secondly, with the information above, the ADT evaluation method based on MCMC is proposed; Thirdly, the evaluation results of this method would be studied and compared with the evaluation results of the maximum likelihood estimation method by two simulation examples. Finally, the method proposed is taken to evaluate the lifetime and reliability of super luminescent diode (SLD) as an engineering application.

Original language	English
Title of host publication	IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011
Pages	1251-1255
Number of pages	5
DOIs	https://doi.org/10.1109/IEEM.2011.6118116
State	Published - 2011
Event	IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011 - Singapore, Singapore Duration: 6 Dec 2011 → 9 Dec 2011

Publication series

Name	IEEE International Conference on Industrial Engineering and Engineering Management
ISSN (Print)	2157-3611
ISSN (Electronic)	2157-362X

Conference

Conference	IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011
Country/Territory	Singapore
City	Singapore
Period	6/12/11 → 9/12/11

Keywords

Accelerated degradation testing
Markov Chain Monte Carlo
reliability
super luminescent diode

Access to Document

10.1109/IEEM.2011.6118116

Cite this

@inproceedings{1537b67e818544989b39d7e71fe3ceb6,

title = "The ADT evaluation method based on MCMC",

abstract = "This paper proposes an accelerated degradation testing (ADT) evaluation method based on Markov Chain Monte Carlo (MCMC) method. Firstly the degradation model, reliability model and accelerated model of ADT are introduced; secondly, with the information above, the ADT evaluation method based on MCMC is proposed; Thirdly, the evaluation results of this method would be studied and compared with the evaluation results of the maximum likelihood estimation method by two simulation examples. Finally, the method proposed is taken to evaluate the lifetime and reliability of super luminescent diode (SLD) as an engineering application.",

keywords = "Accelerated degradation testing, Markov Chain Monte Carlo, reliability, super luminescent diode",

author = "Lizhi Wang and Xiaoyang Li and Tongmin Jiang and Xiaotian Zhuang",

year = "2011",

doi = "10.1109/IEEM.2011.6118116",

language = "英语",

isbn = "9781457707391",

series = "IEEE International Conference on Industrial Engineering and Engineering Management",

pages = "1251--1255",

booktitle = "IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011",

note = "IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011 ; Conference date: 06-12-2011 Through 09-12-2011",

}

Wang, L , Li, X, Jiang, T & Zhuang, X 2011, The ADT evaluation method based on MCMC. in IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011., 6118116, IEEE International Conference on Industrial Engineering and Engineering Management, pp. 1251-1255, IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011, Singapore, Singapore, 6/12/11. https://doi.org/10.1109/IEEM.2011.6118116

The ADT evaluation method based on MCMC. / Wang, Lizhi ; Li, Xiaoyang; Jiang, Tongmin et al.
IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011. 2011. p. 1251-1255 6118116 (IEEE International Conference on Industrial Engineering and Engineering Management).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - The ADT evaluation method based on MCMC

AU - Wang, Lizhi

AU - Li, Xiaoyang

AU - Jiang, Tongmin

AU - Zhuang, Xiaotian

PY - 2011

Y1 - 2011

N2 - This paper proposes an accelerated degradation testing (ADT) evaluation method based on Markov Chain Monte Carlo (MCMC) method. Firstly the degradation model, reliability model and accelerated model of ADT are introduced; secondly, with the information above, the ADT evaluation method based on MCMC is proposed; Thirdly, the evaluation results of this method would be studied and compared with the evaluation results of the maximum likelihood estimation method by two simulation examples. Finally, the method proposed is taken to evaluate the lifetime and reliability of super luminescent diode (SLD) as an engineering application.

AB - This paper proposes an accelerated degradation testing (ADT) evaluation method based on Markov Chain Monte Carlo (MCMC) method. Firstly the degradation model, reliability model and accelerated model of ADT are introduced; secondly, with the information above, the ADT evaluation method based on MCMC is proposed; Thirdly, the evaluation results of this method would be studied and compared with the evaluation results of the maximum likelihood estimation method by two simulation examples. Finally, the method proposed is taken to evaluate the lifetime and reliability of super luminescent diode (SLD) as an engineering application.

KW - Accelerated degradation testing

KW - Markov Chain Monte Carlo

KW - reliability

KW - super luminescent diode

UR - https://www.scopus.com/pages/publications/84863030872

U2 - 10.1109/IEEM.2011.6118116

DO - 10.1109/IEEM.2011.6118116

M3 - 会议稿件

AN - SCOPUS:84863030872

SN - 9781457707391

T3 - IEEE International Conference on Industrial Engineering and Engineering Management

SP - 1251

EP - 1255

BT - IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011

T2 - IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011

Y2 - 6 December 2011 through 9 December 2011

ER -

The ADT evaluation method based on MCMC

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this