The accelerated degradation test and evaluation methods for printed circuit board coatings

Run Zhu; Xiaohui Wang; Xiaoming Ren

doi:10.1109/PHM.2014.6988218

The accelerated degradation test and evaluation methods for printed circuit board coatings

Run Zhu
, Xiaohui Wang
, Xiaoming Ren

School of Reliability and Systems Engineering

Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

Based on the traditional neutral salt fog test, a newly step-stress accelerated degradation test is designed which adds temperature as a step-stress condition. It is proved that the test process is accelerated obviously. The degradation data measured from insulation resistance of printed circuit board could be fitted into degradation curves. Using Arrhenius Equation to build temperature accelerating equations, the reliability curves of the printed circuit board and the coating life could be predicted in salt fog test at 30'C. According to the results, it is found that the accelerated test is reasonable.

Original language	English
Title of host publication	Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	474-477
Number of pages	4
ISBN (Electronic)	9781479979585
DOIs	https://doi.org/10.1109/PHM.2014.6988218
State	Published - 16 Dec 2014
Event	2014 Prognostics and System Health Management Conference, PHM 2014 - Zhangiiaijie City, China Duration: 24 Aug 2014 → 27 Aug 2014

Publication series

Name	Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014

Conference

Conference	2014 Prognostics and System Health Management Conference, PHM 2014
Country/Territory	China
City	Zhangiiaijie City
Period	24/08/14 → 27/08/14

Keywords

insulation resistance
salt fog test
step-stress accelerated degradation test

Access to Document

10.1109/PHM.2014.6988218

Cite this

Zhu, R., Wang, X., & Ren, X. (2014). The accelerated degradation test and evaluation methods for printed circuit board coatings. In Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014 (pp. 474-477). Article 6988218 (Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PHM.2014.6988218

Zhu, Run ; Wang, Xiaohui ; Ren, Xiaoming. / The accelerated degradation test and evaluation methods for printed circuit board coatings. Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 474-477 (Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014).

@inproceedings{1935c9a496ba4a71997f218a1602a373,

title = "The accelerated degradation test and evaluation methods for printed circuit board coatings",

abstract = "Based on the traditional neutral salt fog test, a newly step-stress accelerated degradation test is designed which adds temperature as a step-stress condition. It is proved that the test process is accelerated obviously. The degradation data measured from insulation resistance of printed circuit board could be fitted into degradation curves. Using Arrhenius Equation to build temperature accelerating equations, the reliability curves of the printed circuit board and the coating life could be predicted in salt fog test at 30'C. According to the results, it is found that the accelerated test is reasonable.",

keywords = "insulation resistance, salt fog test, step-stress accelerated degradation test",

author = "Run Zhu and Xiaohui Wang and Xiaoming Ren",

note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 Prognostics and System Health Management Conference, PHM 2014 ; Conference date: 24-08-2014 Through 27-08-2014",

year = "2014",

month = dec,

day = "16",

doi = "10.1109/PHM.2014.6988218",

language = "英语",

series = "Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "474--477",

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address = "美国",

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Zhu, R, Wang, X & Ren, X 2014, The accelerated degradation test and evaluation methods for printed circuit board coatings. in Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014., 6988218, Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014, Institute of Electrical and Electronics Engineers Inc., pp. 474-477, 2014 Prognostics and System Health Management Conference, PHM 2014, Zhangiiaijie City, China, 24/08/14. https://doi.org/10.1109/PHM.2014.6988218

The accelerated degradation test and evaluation methods for printed circuit board coatings. / Zhu, Run; Wang, Xiaohui; Ren, Xiaoming.
Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 474-477 6988218 (Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

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AU - Zhu, Run

AU - Wang, Xiaohui

AU - Ren, Xiaoming

PY - 2014/12/16

Y1 - 2014/12/16

N2 - Based on the traditional neutral salt fog test, a newly step-stress accelerated degradation test is designed which adds temperature as a step-stress condition. It is proved that the test process is accelerated obviously. The degradation data measured from insulation resistance of printed circuit board could be fitted into degradation curves. Using Arrhenius Equation to build temperature accelerating equations, the reliability curves of the printed circuit board and the coating life could be predicted in salt fog test at 30'C. According to the results, it is found that the accelerated test is reasonable.

AB - Based on the traditional neutral salt fog test, a newly step-stress accelerated degradation test is designed which adds temperature as a step-stress condition. It is proved that the test process is accelerated obviously. The degradation data measured from insulation resistance of printed circuit board could be fitted into degradation curves. Using Arrhenius Equation to build temperature accelerating equations, the reliability curves of the printed circuit board and the coating life could be predicted in salt fog test at 30'C. According to the results, it is found that the accelerated test is reasonable.

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KW - step-stress accelerated degradation test

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PB - Institute of Electrical and Electronics Engineers Inc.

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ER -

Zhu R, Wang X, Ren X. The accelerated degradation test and evaluation methods for printed circuit board coatings. In Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 474-477. 6988218. (Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014). doi: 10.1109/PHM.2014.6988218

The accelerated degradation test and evaluation methods for printed circuit board coatings

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Keywords

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