Test system for time-delayed integration charge coupled device of remote camera with wide field of view

In order to select the same high-performance of CCD for a based-multichip CCD camera with wide field of view, a CCD test system was proposed. Firstly, the components of the CCD test system was introduced, and the working principle of CCD was analyzed based on the characteristics of structure for CCD. Secondly, the key technology of CCD imaging assessment circuit was described which is the core of the test system. A CCD timing-driven strategy based on charge pump and a power strategy based on closed-loop automatic adjustable voltage was proposed. A CCD test method based on image processing was proposed for CCD pixel response non-uniformity, blind pixels, hot and cold pixels which were mainly considered by the designer. Finally, the 17 CCDs of the XX-X remote camera were tested by the CCD test system. The experiments results show that the indicators of 17 CCDs are in line with the design requirements of the project. The response non-uniformity of all the CCDs is less than 5%, the responsivity is greater than 985 V/(J·cm^-2), and the dynamic range is greater than 2320:1. The CCD test system can evaluate comprehensively the performance of CCD.