Terahertz thermal wave nondestructive test

Da Peng Chen; Chun Fei Xing; Zheng Zhang; Cun Lin Zhang

Terahertz thermal wave nondestructive test

Da Peng Chen^*
, Chun Fei Xing
, Zheng Zhang
, Cun Lin Zhang

^*Corresponding author for this work

School of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

This work aims at developing a new excitation method for thermal wave nondestructive test(NDT)-Terahertz excitation. In the paper we introduce a theoretical model of heat conduction for periodical THz excitation. BWO (backward wave oscillator) terahertz source is employed to heat a carbon fiber plate with wave absorbing coating, surface temperature variations and distributions are captured by an infrared camera, and Canny edge algorithm is used to process thermal images to show the defects. Result of flash pulse thermography serves as comparison, and the advantages of THz thermal wave NDT are discussed. The combination of THz technology and infrared thermal wave NDT is realized.

Original language	English
Article number	024202
Journal	Wuli Xuebao/Acta Physica Sinica
Volume	61
Issue number	2
State	Published - Feb 2012

Keywords

Backward wave oscillator (BWO)
Nondestructive testing
Thermal wave imaging
THz excitation

Cite this

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title = "Terahertz thermal wave nondestructive test",

abstract = "This work aims at developing a new excitation method for thermal wave nondestructive test(NDT)-Terahertz excitation. In the paper we introduce a theoretical model of heat conduction for periodical THz excitation. BWO (backward wave oscillator) terahertz source is employed to heat a carbon fiber plate with wave absorbing coating, surface temperature variations and distributions are captured by an infrared camera, and Canny edge algorithm is used to process thermal images to show the defects. Result of flash pulse thermography serves as comparison, and the advantages of THz thermal wave NDT are discussed. The combination of THz technology and infrared thermal wave NDT is realized.",

keywords = "Backward wave oscillator (BWO), Nondestructive testing, Thermal wave imaging, THz excitation",

author = "Chen, \{Da Peng\} and Xing, \{Chun Fei\} and Zheng Zhang and Zhang, \{Cun Lin\}",

year = "2012",

month = feb,

language = "英语",

volume = "61",

journal = "Wuli Xuebao/Acta Physica Sinica",

issn = "1000-3290",

publisher = "Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences",

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T1 - Terahertz thermal wave nondestructive test

AU - Chen, Da Peng

AU - Xing, Chun Fei

AU - Zhang, Zheng

AU - Zhang, Cun Lin

PY - 2012/2

Y1 - 2012/2

N2 - This work aims at developing a new excitation method for thermal wave nondestructive test(NDT)-Terahertz excitation. In the paper we introduce a theoretical model of heat conduction for periodical THz excitation. BWO (backward wave oscillator) terahertz source is employed to heat a carbon fiber plate with wave absorbing coating, surface temperature variations and distributions are captured by an infrared camera, and Canny edge algorithm is used to process thermal images to show the defects. Result of flash pulse thermography serves as comparison, and the advantages of THz thermal wave NDT are discussed. The combination of THz technology and infrared thermal wave NDT is realized.

AB - This work aims at developing a new excitation method for thermal wave nondestructive test(NDT)-Terahertz excitation. In the paper we introduce a theoretical model of heat conduction for periodical THz excitation. BWO (backward wave oscillator) terahertz source is employed to heat a carbon fiber plate with wave absorbing coating, surface temperature variations and distributions are captured by an infrared camera, and Canny edge algorithm is used to process thermal images to show the defects. Result of flash pulse thermography serves as comparison, and the advantages of THz thermal wave NDT are discussed. The combination of THz technology and infrared thermal wave NDT is realized.

KW - Backward wave oscillator (BWO)

KW - Nondestructive testing

KW - Thermal wave imaging

KW - THz excitation

UR - https://www.scopus.com/pages/publications/84863153821

M3 - 文章

AN - SCOPUS:84863153821

SN - 1000-3290

VL - 61

JO - Wuli Xuebao/Acta Physica Sinica

JF - Wuli Xuebao/Acta Physica Sinica

IS - 2

M1 - 024202

ER -

Terahertz thermal wave nondestructive test

Abstract

Keywords

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