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Temporal Observation of Barkhausen Avalanche with Short-range Interaction in Perpendicularly Magnetized Thin Film

  • Beihang University
  • Centre de Nanosciences et de Nanotechnologies
  • Laboratoire Lumière, Matière et Interfaces
  • Truth Instrument Co. Ltd.

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

A method for measuring the temporal Bakehausen scaling exponent in a two-dimensional thin film were presented. The scaling exponent with long-range interaction was observed to be consistent with theoretical and experimental results. In addition, the characteristic exponent with short-range interaction was demonstrated. This method would contribute to the understanding of DW dynamics and help to optimize spintronic devices.

Original languageEnglish
Title of host publicationMaterials Science Forum
PublisherTrans Tech Publications Ltd
Pages183-187
Number of pages5
DOIs
StatePublished - 2022

Publication series

NameMaterials Science Forum
Volume1070
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Keywords

  • Barkhausen effect
  • domain wall
  • magneto-optical Kerr effect
  • perpendicular magnetic anisotropy
  • short-range interaction

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