@inproceedings{0e3e7358066043ff9ea7b45d88cdf5e1,
title = "Temperature-humidity oriented reliability prediction for electronic equipments",
abstract = "This paper presents a practical method of reliability prediction for electronic devices with operating temperature and relative humidity that will not always be in steady state. Since operating temperature (Tu) and relative humidity (RHu) are various in different regions, the authors use temperature probability distribution function f(Tu) to indicate the change of Tu, and humidity probability distribution function g(RHu) is used to indicate the variation of RHu. In order to estimate equipment reliability for the entire area of product usage, this paper uses these two functions to modify prediction model. The proposed method offers a way to predict the average value of failure rate for the entire area of product usage with accelerated test data and climate information.",
keywords = "accelerated test, electronic devices, operating temperature, relative humidity, reliability prediction",
author = "Xiaoxue Ding and Yufeng Sun and Weiwei Hu and Bangyan Qi",
year = "2011",
doi = "10.1109/ICRMS.2011.5979252",
language = "英语",
isbn = "9781612846644",
series = "ICRMS'2011 - Safety First, Reliability Primary: Proceedings of 2011 9th International Conference on Reliability, Maintainability and Safety",
pages = "149--153",
booktitle = "ICRMS'2011 - Safety First, Reliability Primary",
note = "2011 9th International Conference on Reliability, Maintainability and Safety: Safety First, Reliability Primary, ICRMS'2011 ; Conference date: 12-06-2011 Through 15-06-2011",
}