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Take Your Model Further: A General Post-refinement Network for Light Field Disparity Estimation via BadPix Correction

  • Rongshan Chen
  • , Hao Sheng*
  • , Da Yang
  • , Sizhe Wang
  • , Zhenglong Cui
  • , Ruixuan Cong
  • *Corresponding author for this work
  • Beihang University
  • Beihang Hangzhou Innovation Institute Yuhang
  • Macao Polytechnic University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Most existing light field (LF) disparity estimation algorithms focus on handling occlusion, texture-less or other areas that harm LF structure to improve accuracy, while ignoring other potential modeling ideas. In this paper, we propose a novel idea called Bad Pixel (BadPix) correction for method modeling, then implement a general post-refinement network for LF disparity estimation: Bad-pixel Correction Network (BpCNet). Given an initial disparity map generated by a specific algorithm, we assume that all BadPixs on it are in a small range. Then BpCNet is modeled as a fine-grained search strategy, and a more accurate result can be obtained by evaluating the consistency of LF images in this limited range. Due to the assumption and the consistency between input and output, BpCNet can perform as a general post-refinement network, and can work on almost all existing algorithms iteratively. We demonstrate the feasibility of our theory through extensive experiments, and achieve remarkable performance on the HCI 4D Light Field Benchmark.

Original languageEnglish
Title of host publicationAAAI-23 Technical Tracks 1
EditorsBrian Williams, Yiling Chen, Jennifer Neville
PublisherAAAI press
Pages331-339
Number of pages9
ISBN (Electronic)9781577358800
DOIs
StatePublished - 27 Jun 2023
Event37th AAAI Conference on Artificial Intelligence, AAAI 2023 - Washington, United States
Duration: 7 Feb 202314 Feb 2023

Publication series

NameProceedings of the 37th AAAI Conference on Artificial Intelligence, AAAI 2023
Volume37

Conference

Conference37th AAAI Conference on Artificial Intelligence, AAAI 2023
Country/TerritoryUnited States
CityWashington
Period7/02/2314/02/23

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