TY - GEN
T1 - System Belief Reliability Evaluation Method Based on Uncertainty Theory
AU - Yang, Tianyu
AU - Chen, Ying
AU - Zu, Tianpei
AU - Zhang, Qingyuan
AU - Wang, Yanfang
AU - Kang, Rui
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - On the basis of probability theory, fitting data based on the law of large numbers can quickly obtain the distribution or variation patterns of data. However, in the system design phase, the system has not yet been put into use, and reliability cannot be analyzed through statistical fault data. The performance data of various functions and modules in the design phase is also relatively limited. In this case, directly using probability theory methods to fit the data would result in significant cognitive uncertainty. Therefore, this article proposes a method for analyzing the reliability of test data from the perspective of functional performance, based on uncertainty theory. This method collects data on key parameters of the system and fits their distribution and two factor degradation patterns. From the perspective of functional margin, it establishes disciplinary equations for performance parameters and injects the distribution and degradation patterns of key parameters to conduct reliable analysis. This article takes integrated operational amplification circuits as a case study to compare the analysis results based on uncertainty theory and probability theory. The results indicate that in the case of limited data, uncertainty theory can better describe cognitive uncertainty in fitting, and reliability analysis results are more conservative.
AB - On the basis of probability theory, fitting data based on the law of large numbers can quickly obtain the distribution or variation patterns of data. However, in the system design phase, the system has not yet been put into use, and reliability cannot be analyzed through statistical fault data. The performance data of various functions and modules in the design phase is also relatively limited. In this case, directly using probability theory methods to fit the data would result in significant cognitive uncertainty. Therefore, this article proposes a method for analyzing the reliability of test data from the perspective of functional performance, based on uncertainty theory. This method collects data on key parameters of the system and fits their distribution and two factor degradation patterns. From the perspective of functional margin, it establishes disciplinary equations for performance parameters and injects the distribution and degradation patterns of key parameters to conduct reliable analysis. This article takes integrated operational amplification circuits as a case study to compare the analysis results based on uncertainty theory and probability theory. The results indicate that in the case of limited data, uncertainty theory can better describe cognitive uncertainty in fitting, and reliability analysis results are more conservative.
KW - belief reliability evaluation
KW - belief reliability theory
KW - reliability analysis process
KW - small sample data
KW - uncertainty theory
UR - https://www.scopus.com/pages/publications/105003202329
U2 - 10.1109/ICSRS63046.2024.10927441
DO - 10.1109/ICSRS63046.2024.10927441
M3 - 会议稿件
AN - SCOPUS:105003202329
T3 - 2024 8th International Conference on System Reliability and Safety, ICSRS 2024
SP - 822
EP - 826
BT - 2024 8th International Conference on System Reliability and Safety, ICSRS 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th International Conference on System Reliability and Safety, ICSRS 2024
Y2 - 20 November 2024 through 22 November 2024
ER -