Abstract
Two-dimensional layers of metal dichalcogenides have attracted much attention because of their ultrathin thickness and potential applications in electronics and optoelectronics. Monolayer SnS2, with a band gap of ~2.6 eV, has an octahedral lattice made of two atomic layers of sulfur and one atomic layer of tin. Till date, there have been limited reports on the growth of large-scale and high quality SnS2 atomic layers and the investigation of their properties as a semiconductor. Here, we report the chemical vapor deposition (CVD) growth of atomic-layer SnS2 with a large crystal size and uniformity. In addition, the number of layers can be changed from a monolayer to few layers and to bulk by changing the growth time. Scanning transmission electron microscopy was used to analyze the atomic structure and demonstrate the 2H stacking poly-type of different layers. The resultant SnS2 crystals is used as a photodetector with external quantum efficiency as high as 150%, suggesting promise for optoelectronic applications. [Figure not available: see fulltext.].
| Original language | English |
|---|---|
| Pages (from-to) | 2386-2394 |
| Number of pages | 9 |
| Journal | Nano Research |
| Volume | 10 |
| Issue number | 7 |
| DOIs | |
| State | Published - 1 Jul 2017 |
Keywords
- chemical vapor deposition
- metal dichalcogenides
- photodetector
- tin disulfide
- two-dimensional materials
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