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Superior hydrogen storage and electrochemical properties of Mg xNi100-x/Pd films at room temperature

  • Tong Liu*
  • , Yurong Cao
  • , Gongbiao Xin
  • , Xingguo Li
  • *Corresponding author for this work
  • Beihang University
  • Peking University

Research output: Contribution to journalArticlepeer-review

Abstract

The MgxNi100-x films of 100 nm have been prepared by magnetron co-sputtering Mg and Ni targets, and a Pd layer of 10 nm was deposited on these films by magnetron sputtering a Pd target. Mg2Ni and MgNi2 are directly generated during the co-sputtering process in the Mg84Ni16/Pd and Mg48Ni52/Pd films. The hydrogen storage properties of the films under 0.1 MPa H2 at 298 K were investigated. The hydrogenation of the Mg84Ni16/Pd film saturates within 45 s and exhibits the faster absorption kinetics compared with Mg94Ni6/Pd and Mg48Ni52/Pd films. The electrochemical properties of the MgxNi100-x/Pd films were investigated in 6 M KOH with a three-electrode cell. The Mg 84Ni16/Pd film can be activated just at the first cycle. The maximum discharge capacity of the Mg84Ni16/Pd film is 482.7 mAh g-1, the highest among these films.

Original languageEnglish
Pages (from-to)13692-13697
Number of pages6
JournalDalton Transactions
Volume42
Issue number37
DOIs
StatePublished - 7 Oct 2013

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