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Study on the performance of Y-branch waveguide modulator affected by the fabrication

  • Beihang University
  • Flight Automatic Control Research Institute

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The performance of Y-branch waveguide (YBW) modulator which is affected by the fabrication has been researched. The range of Y-branch corner deviation is obtained by analyzing the structural loss of the branch in the YBW which is limited by fabrication resolution. The effects on splitting ratio, mode field and coupling loss of YBW are also discussed through changing the waveguide width. It can be obtained that the difference between the two widths should be less than 0.25μm to meet the requirement of 5% error. And the maximum coupling efficiency can be achieved by adjusting the fabrication of waveguide to change the waveguide mode field. The corresponding fabrication tolerance can be attained based on the analysis.

Original languageEnglish
Title of host publicationMicro-Nano Technology XIV
PublisherTrans Tech Publications Ltd
Pages62-66
Number of pages5
ISBN (Print)9783037857397
DOIs
StatePublished - 2013
Event14th Annual Conference and the 3rd International Conference of the Chinese Society of Micro-Nano Technology, CSMNT 2012 - Hangzhou, China
Duration: 4 Nov 20127 Nov 2012

Publication series

NameKey Engineering Materials
Volume562-565
ISSN (Print)1013-9826
ISSN (Electronic)1662-9795

Conference

Conference14th Annual Conference and the 3rd International Conference of the Chinese Society of Micro-Nano Technology, CSMNT 2012
Country/TerritoryChina
CityHangzhou
Period4/11/127/11/12

Keywords

  • Coupling loss
  • Fabrication deviation
  • Splitting ratio
  • Structural loss
  • Y-branch waveguide

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