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Study on life prediction method of mosfet thermal environment experiments based on extended kalman filter

  • Ke Li*
  • , Yuxiang Zhang
  • , Shimin Song
  • , Zhijian Zhao
  • , Lijing Wang
  • *Corresponding author for this work
  • Beihang University
  • China Aerospace Science and Technology Corporation
  • Naval Aeronautical and Astronatical University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The prediction method of the residual service life of power MOSFET is studied in this paper. By analyzing the data collected under the existing thermal overload accelerated aging experiment, after processing the data, the failure threshold was set by using the prediction algorithm based on data drive and model to predict the residual life of power MOSFET. The traditional SVR algorithm requires a lot of parameter selection and only a few parameter convergence. The prediction algorithm model is based on Extended Kalman Filter, the extended Kalman filter is relative to the advantage of support vector machine (SVM) regression is used to predict the variance is small, and can be found in a wide range of required to predict the sample interval and the predicted results are more accurate, the test results verify the feasibility of this method.

Original languageEnglish
Title of host publicationMan-Machine-Environment System Engineering - Proceedings of the 20th International Conference on MMESE, 2020
EditorsShengzhao Long, Balbir S. Dhillon
PublisherSpringer Science and Business Media Deutschland GmbH
Pages495-503
Number of pages9
ISBN (Print)9789811569777
DOIs
StatePublished - 2020
Event20th International Conference on Man-Machine-Environment System Engineering, MMESE 2020 - Zhengzhou, China
Duration: 24 Oct 202026 Oct 2020

Publication series

NameLecture Notes in Electrical Engineering
Volume645
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

Conference20th International Conference on Man-Machine-Environment System Engineering, MMESE 2020
Country/TerritoryChina
CityZhengzhou
Period24/10/2026/10/20

Keywords

  • Accelerated aging
  • Extended Kalman filter
  • Failure mechanism
  • Life prediction
  • Power MOSFET

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