Abstract
The intense pulsed ion beam (IPIB) mixing effect of Ni/Ti and Al/Ti systems are studied. Compared with common ion beam, it is obvious that the mixing layers formed by IPIB irradiation are thicker, and the mixing rate is much higher. However, the IPIB mixing effects are various for different fdm/substrate systems because of their different thermodynamic properties. During IPIB irradiation, film material lost seriously, especially for the samples with big differences in their film and substrate thermal dynamic parameters. Two IPIB mixing mechanisms which are distinct from common ion beam mixing are discussed and the reason of mass loss of film materials are analyzed.
| Original language | English |
|---|---|
| Pages (from-to) | 23-27 |
| Number of pages | 5 |
| Journal | Beijing Daxue Xuebao (Ziran Kexue Ban)/Acta Scientiarum Naturalium Universitatis Pekinensis |
| Volume | 44 |
| Issue number | 1 |
| State | Published - Jan 2008 |
| Externally published | Yes |
Keywords
- Intense pulsed ion beam
- Ion beam mixing
- Mass loss
- Thermodynamic properties
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