Study on intense pulsed ion beam mixing of Ni/Ti and Al/Ti systems

  • Yijun Shang*
  • , Sha Yan
  • , Xiaoyun Le
  • , Weijiang Zhao
  • , Yugang Wang
  • , Jianming Xue
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The intense pulsed ion beam (IPIB) mixing effect of Ni/Ti and Al/Ti systems are studied. Compared with common ion beam, it is obvious that the mixing layers formed by IPIB irradiation are thicker, and the mixing rate is much higher. However, the IPIB mixing effects are various for different fdm/substrate systems because of their different thermodynamic properties. During IPIB irradiation, film material lost seriously, especially for the samples with big differences in their film and substrate thermal dynamic parameters. Two IPIB mixing mechanisms which are distinct from common ion beam mixing are discussed and the reason of mass loss of film materials are analyzed.

Original languageEnglish
Pages (from-to)23-27
Number of pages5
JournalBeijing Daxue Xuebao (Ziran Kexue Ban)/Acta Scientiarum Naturalium Universitatis Pekinensis
Volume44
Issue number1
StatePublished - Jan 2008
Externally publishedYes

Keywords

  • Intense pulsed ion beam
  • Ion beam mixing
  • Mass loss
  • Thermodynamic properties

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