TY - GEN
T1 - Study of the industrial control network reliability comprehensive model
AU - Du, Kang
AU - Zhao, Guangyan
AU - Ma, Xiaodong
AU - Hu, Weiwei
N1 - Publisher Copyright:
© 2013 IEEE.
PY - 2013
Y1 - 2013
N2 - Industrial control network was a complex system which consisted of operating system, control software, failure diagnosis software, hardware and connecting device. In this paper, we studied how the typical industrial control network works and proposed a reliability comprehensive model. Based on the network device layer reliability model and topology layer reliability model, this model considered task demands, task profiles as well as human factors. This model was able to simulate the failure behavior and failure characteristics more realistically than ever. In the end, through a typical case we analyzed its specific application.
AB - Industrial control network was a complex system which consisted of operating system, control software, failure diagnosis software, hardware and connecting device. In this paper, we studied how the typical industrial control network works and proposed a reliability comprehensive model. Based on the network device layer reliability model and topology layer reliability model, this model considered task demands, task profiles as well as human factors. This model was able to simulate the failure behavior and failure characteristics more realistically than ever. In the end, through a typical case we analyzed its specific application.
KW - Industrial control network
KW - Monte carlo
KW - Reliability comprehensive model
KW - Software and hardware modeling
UR - https://www.scopus.com/pages/publications/84918592604
U2 - 10.1109/MEC.2013.6885062
DO - 10.1109/MEC.2013.6885062
M3 - 会议稿件
AN - SCOPUS:84918592604
T3 - Proceedings - 2013 International Conference on Mechatronic Sciences, Electric Engineering and Computer, MEC 2013
SP - 131
EP - 134
BT - Proceedings - 2013 International Conference on Mechatronic Sciences, Electric Engineering and Computer, MEC 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2013 International Conference on Mechatronic Sciences, Electric Engineering and Computer, MEC 2013
Y2 - 20 December 2013 through 22 December 2013
ER -