Study of intense pulsed ion beam mixing with RBS

Sha Yan; Xiaoyun Le; Weijiang Zhao; Yugang Wang; Jianming Xue

Study of intense pulsed ion beam mixing with RBS

Sha Yan^*
, Xiaoyun Le
, Weijiang Zhao
, Yugang Wang
, Jianming Xue

^*Corresponding author for this work

School of Physics

Peking University

Research output: Contribution to journal › Article › peer-review

Abstract

The mixing effect of three different film/substrate systems, Ti/Al, Al/Ti and Ni/Ti, which were irradiated by intense pulsed ion beam, was studied with Rutherford backscattering spectroscopy (RBS). It was found that a quite well mixed layer with gradient components was formed in Ni/Ti combination. The thickness of the mixing layer is far beyond the ion range. They were mixed probably in molten state. It was also found that the mixing degree strongly related to the difference of the melting points of film/substrate couple, as well as the difference of the surface tensions.

Original language	English
Pages (from-to)	125-128
Number of pages	4
Journal	He Jishu/Nuclear Techniques
Volume	29
Issue number	2
State	Published - Feb 2006

Keywords

Intense pulsed ion beam
Ion beam mixing
Rutherford backscattering spectroscopy

Cite this

@article{5bc8665698714e7cbdf07759a6cc80ab,

title = "Study of intense pulsed ion beam mixing with RBS",

abstract = "The mixing effect of three different film/substrate systems, Ti/Al, Al/Ti and Ni/Ti, which were irradiated by intense pulsed ion beam, was studied with Rutherford backscattering spectroscopy (RBS). It was found that a quite well mixed layer with gradient components was formed in Ni/Ti combination. The thickness of the mixing layer is far beyond the ion range. They were mixed probably in molten state. It was also found that the mixing degree strongly related to the difference of the melting points of film/substrate couple, as well as the difference of the surface tensions.",

keywords = "Intense pulsed ion beam, Ion beam mixing, Rutherford backscattering spectroscopy",

author = "Sha Yan and Xiaoyun Le and Weijiang Zhao and Yugang Wang and Jianming Xue",

year = "2006",

month = feb,

language = "英语",

volume = "29",

pages = "125--128",

journal = "He Jishu/Nuclear Techniques",

issn = "0253-3219",

publisher = "Science Press ",

number = "2",

}

TY - JOUR

T1 - Study of intense pulsed ion beam mixing with RBS

AU - Yan, Sha

AU - Le, Xiaoyun

AU - Zhao, Weijiang

AU - Wang, Yugang

AU - Xue, Jianming

PY - 2006/2

Y1 - 2006/2

N2 - The mixing effect of three different film/substrate systems, Ti/Al, Al/Ti and Ni/Ti, which were irradiated by intense pulsed ion beam, was studied with Rutherford backscattering spectroscopy (RBS). It was found that a quite well mixed layer with gradient components was formed in Ni/Ti combination. The thickness of the mixing layer is far beyond the ion range. They were mixed probably in molten state. It was also found that the mixing degree strongly related to the difference of the melting points of film/substrate couple, as well as the difference of the surface tensions.

AB - The mixing effect of three different film/substrate systems, Ti/Al, Al/Ti and Ni/Ti, which were irradiated by intense pulsed ion beam, was studied with Rutherford backscattering spectroscopy (RBS). It was found that a quite well mixed layer with gradient components was formed in Ni/Ti combination. The thickness of the mixing layer is far beyond the ion range. They were mixed probably in molten state. It was also found that the mixing degree strongly related to the difference of the melting points of film/substrate couple, as well as the difference of the surface tensions.

KW - Intense pulsed ion beam

KW - Ion beam mixing

KW - Rutherford backscattering spectroscopy

UR - https://www.scopus.com/pages/publications/33644945921

M3 - 文章

AN - SCOPUS:33644945921

SN - 0253-3219

VL - 29

SP - 125

EP - 128

JO - He Jishu/Nuclear Techniques

JF - He Jishu/Nuclear Techniques

IS - 2

ER -

Study of intense pulsed ion beam mixing with RBS

Abstract

Keywords

Other files and links

Fingerprint

Cite this