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Structure design and characteristics of 3T sense-switch pFlash for computing-in-memory

  • Wei Zhao*
  • , Jinghe Wei
  • , Guozhu Liu*
  • , Yidan Wei
  • , Yingqiang Wei
  • , Zhiyuan Sui
  • , Meijie Liu
  • , Qi Xi
  • , Xinhe Wang
  • , Zongguang Yu
  • , Juyan Xu
  • *Corresponding author for this work
  • China Electronics Technology Group Corporation
  • National Key Laboratory of Integrated Circuits and Microsystems
  • Ministry of Industry and Information Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, we propose a novel structure for a 3T sense-switch pFlash (SSpF) that is specially designed for computing-in-memory. By leveraging the effect of programming pulse width modulation, the 3T-SSpF can be adjusted to more than a hundred conductance states. Furthermore, the conductance level and conductance variation of a 256k 3T-SSpF array are evaluated, and a typical neural network is implemented and applied to the MNIST and CIFAR-10 datasets. The network shows reasonable performance, with a loss of accuracy less than 1%; this approach will therefore enable the realization of more accurate NVM-based neural networks for edge inference.

Original languageEnglish
Title of host publication9th IEEE Electron Devices Technology and Manufacturing Conference
Subtitle of host publicationShaping the Future with Innovations in Devices and Manufacturing, EDTM 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331504168
DOIs
StatePublished - 2025
Event9th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2025 - Hong Kong, Hong Kong SAR
Duration: 9 Mar 202512 Mar 2025

Publication series

Name9th IEEE Electron Devices Technology and Manufacturing Conference: Shaping the Future with Innovations in Devices and Manufacturing, EDTM 2025

Conference

Conference9th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2025
Country/TerritoryHong Kong SAR
CityHong Kong
Period9/03/2512/03/25

Keywords

  • Computing-in-memory
  • Flash
  • NVM

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