Abstract
Self-assembled In0.9Ga0.1As, In0.9Al0.1As, and InAs quantum dots (QD) were fabricated in an InAlAs matrix lattice-matched to an InP substrate by molecular beam epitaxy. Preliminary characterizations were performed using transmission electron microscopy, photoluminescence, and reflection high-energy electron diffraction. Experimental results reveal clear differences in QD formation, size distribution, and luminescence between the InAs and In0.9(Ga/Al)0.1 As samples, which show the potential of introducing ternary compositions to adjust the structural and optical properties of QDs on an InP substrate.
| Original language | English |
|---|---|
| Pages (from-to) | 533-536 |
| Number of pages | 4 |
| Journal | Journal of Applied Physics |
| Volume | 88 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jul 2000 |
| Externally published | Yes |
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